Previous Page  8 / 68 Next Page
Show Menu
Previous Page 8 / 68 Next Page
Page Background

Chip Scale Review May June 201

5 []


by combining PCB, semiconductor back-

end, semiconductor WLP and LCD Gen 2.5

glass (370X470mm) processing technologies

[9]. This effort requires high-accuracy die

bonding and die shift compensation at

film lamination, lower warpage sheet form

film lamination, good copper trace plating

uniformity control at large panel area, and also

precise photolithographic technique. Known

good die are reconstructed on the LCDGen 2.5

glass carrier with adhesive temporary bonding

material. Processing issues are identified as

warpage, die shift “coordinates compensation

at lithography” and Cu plating uniformity.

J-Devices is also attempting to develop

panel based processing for low-cost

fan-out packaging technology [11,13]. The

J-Devices wafer fan-out package (WFOP) is

compared to the eWLB in the following table


Figure 2

). The metal plate serves to minimize

warpage and decrease thermal issues. Greater

than 1000hrs of package and board-level

reliability have been achieved. It should be

stated that such J-Devices’ panel production is

not yet in high-volumemanufacturing (HVM).

Second-generation FOWLP

The second-generation of FOWLParemulti-

chip structures including familiar PoP and SiP

architectures and the incorporation of passives.

Double-sided and stacked solutions are created

by through-mold vias (TMV). These new

multi-die solutions are also available from


packages are generating increased interest in

this packaging technology (

Figure 3


The FOWLP market

Yole’s analysts estimate that the 2014

market for FOWLP is ~$174MM with

STATS ChipPAC having the largest share

at 59% of the market (

Figure 4

). With

several new suppliers coming on line, we

see the market growing at a 30% CAGR to

>$600MM by 2020.

FOWLP challenges

Despite its many positive attributes,

challenges remain for FOWLP that impede its

widespread adoption. IME has initiated aHigh-

Density FOWLP Consortium that includes



Materials, TOK, KLA-Tencor, SPTS, and

others [13]. Their compilation of challenges

and proposed solutions is shown in

Figure 5


The two main challenges of fan-out

packaging are die shift and warpage of the

molded wafer. Die shift impacts the alignment

of the RDL on the die pad. Changes in die

positions are caused by thermal expansion of

the carrier during molding and shrinking of

the mold compound upon cooling. Warpage

impacts equipment handling. Processing

equipment will not accept the molded wafer

if warpage is too high. Proper selection of

the mold compound and optimizing molding

process conditions are therefore needed to

minimize warpage of the molded wafer.

Finding the proper RDL insulator with a

low-temperature cure has been a lingering

problem. Typical materials with cure

temperatures > 250C cannot be used because

they exceed the T


of the molding resins.

Figure 2:

PComparison of J-Devices’ WFOP™ to the Infineon eWLB.

SOURCE: Yole Développement.

Figure 3:

Second-generation FOWLP packaging options. SOURCE: Fan-Out and Embedded Die:

Technologies & Market Trends Report – Feb. 2015.

Figure 4:

S2014 FOWLP revenue ($MM). SOURCE: Fan-Out and Embedded Die: Technologies & Market Trends

Report – Feb. 2015.